CVE-2026-68991

critical

Description

In the Samsung Exynos ENN NeuralNetworks HAL, improper input validation during request processing can cause memory corruption and lead to a denial of service condition.

References

https://semiconductor.samsung.com/support/quality-support/product-security-updates/

https://euvd.enisa.europa.eu/vulnerability/EUVD-2026-117284

Details

Source: Mitre, NVD

Published: 2026-11-05

Updated: 2026-11-10

Risk Information

CVSS v2

Base Score: 10

Vector: CVSS2#AV:N/AC:L/Au:N/C:C/I:C/A:C

Severity: Critical

CVSS v3

Base Score: 9.8

Vector: CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H