Detections
Analytics
CVE-2022-33214
high
Description
Memory corruption in display due to time-of-check time-of-use of metadata reserved size in Snapdragon Auto, Snapdragon Compute, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables
References
https://www.qualcomm.com/company/product-security/bulletins/october-2022-bulletin