Detections
Analytics
CVE-2022-25696
high
Description
Memory corruption in display due to time-of-check time-of-use race condition during map or unmap in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables
References
https://www.qualcomm.com/company/product-security/bulletins/september-2022-bulletin